[1].
67/7 322-326 (2024) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] 岩田 太 , 吉元 裕貴, 中澤 謙太 [DOI]
[2]. Human induced pluripotent stem cells are resistant to human cytomegalovirus infection primarily at the attachment level due to the reduced expression of cell-surface heparan sulfate
J. Virol. / - (2024) [Refereed] refereed [Internationally co-authored papers] internationally co-authored paper
[Lead author or co-author] co-author
[Author] H. Kawasaki, T. Hariyama, I. Kosugi, S. Meguro, F. Iwata, K. Shimizu, Y. Magata, and T. Iwashita [DOI]
[3]. In-process sintering of Au nanoparticles deposited in laser-assisted electrophoretic deposition
Opt. Express 31/25 41726-41739 (2023) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] Y Yoshimoto, K Nakazawa, M Ishikawa, A Ono, F Iwata [DOI]
[4]. In-process monitoring of atmospheric pressure plasma jet etching by a confocal laser displacement sensor
Microsys. 29/ 1107-1116 (2023) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] T. Tomita, K. Nakazawa, T. Hiraoka, Y. Otsuka, K. Nakamura, and F. Iwata
[5].
618/ 28-34 (2023) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] 岩田 太 中澤 謙太
[6]. Scanning ion conductance microscope with a capacitance compensated current source amplifier
Rev. Sci. Instrum. 94/7 073705- (2023) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] K. Nakazawa, T. Tsukamoto, F. Iwata [DOI]
[7]. Microneedle Array-Assisted, Direct Delivery of Genome-Editing Proteins Into Plant Tissue
Front. Plant Sci. 13/ - 878059 (2022) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] A. Viswan, A. Yamagishi, M. Hoshi, Y. Furuhata, Y. Kato, N. Makimoto, T. Takeshita, T. Kobayashi, F. Iwata, M. Kimura, T. Yoshizumi and C. Nakamura [DOI]
[8]. Precise Deposition of Carbon Nanotube Bundles by Inkjet-Printing on a CMOS-Compatible Platform
Materials 15/14 4935- (2022) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] R. S. Singh, K. Takagi, T. Aoki, J. H. Moon, Y. Neo, F. Iwata, H. Mimura and D. Moraru [DOI]
[9]. Imaging of an electret film fabricated on a micro-machined energy harvester by a Kelvin probe force microscope
IEEE Trans. Instrum. Meas. 71/ 4501907 (7p) - (2022) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] K. Nakazawa, K. Fukazawa, T. Uruma, G. Hashiguchi, and F. Iwata [DOI]
[10]. Sub-micrometer plasma-enhanced chemical vapor deposition using an atmospheric pressure plasma jet localized by a nanopipette scanning probe microscope
J. Micromech. Microeng 32/ 015006 (10pp)- (2022) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] S. Yamamoto, K. Nakazawa, A. Ogino and F. Iwata
[11]. Additive Manufacturing of Metal Micro-ring and Tube by Laser-Assisted Electrophoretic Deposition with Laguerre–Gaussian Beam
Nanomanufacturing and Metrology 4/ 271-277 (2021) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] K. Nakazawa, S. Ozawa, and F. Iwata [Notes] Published: 04 January 2021
Issue Date: December 2021
[DOI]
[12]. Comparison of scanning ion-conductance microscopy with scanning electron microscopy for imaging the surface topography of cells and tissues
Bioanalytical Reviews, Springer, Berlin, Heidelberg. (Books) / - (2021) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Ushiki, F. Iwata, M. Nakajima and Y. Mizutani, [DOI]
[13]. Scanning ion conductance microscopy of isolated metaphase chromosomes in a liquid environment
Chromosome Res. 29/ 95-106 (2021) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Ushiki, K. Ishizaki, Y. Mizutani, M. Nakajima, and F. Iwata [DOI]
[14]. Micromachining of polymers using atmospheric pressure inductively coupled helium plasma localized by a scanning nanopipette probe microscope
J. Micromech. Microeng. 31/6 065008 (10pp) - (2021) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] S. Toda, K. Nakazawa, A. Ogino, M. Shimomura and F. Iwata [Notes] Published online: 15 April 2021
[DOI]
[15]. Scanning ion-conductance microscopy with a double-barreled nanopipette for topographic imaging of charged chromosomes
Microscopy / - (2021) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] Futoshi Iwata, Tatsuru Shirasawa, Yusuke Mizutani, Tatsuo Ushiki [DOI]
[16]. High spatial resolution multimodal imaging by tapping-mode scanning probe electrospray ionization with feedback control
Anal. Chem. 93/4 2263-2272 (2021) [Refereed] refereed [Internationally co-authored papers] internationally co-authored paper
[Lead author or co-author] co-author
[Author] Y. Otsuka, B. Kamihoriuchi, A. Takeuchi, F. Iwata, S. Tortorella, and T. Matsumoto [DOI]
[17]. Atmospheric He/O2 plasma jet fine etching with a scanning probe microscope
AIP Adovantes 10/ - (2020) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] K. Nakazawa, S. Yamamoto, E. Nakagawa, A. Ogino, M. Shimomura, and F. Iwata
[18]. Metals by Micro‐Scale Additive Manufacturing: Comparison of Microstructure and Mechanical Properties
Adv. Funct. Mater. 30/ 1910491 - (2020) [Refereed] refereed [Internationally co-authored papers] internationally co-authored paper
[Lead author or co-author] co-author
[Author] A. Reiser, L. Koch, K. A. Dunn, T. Matsuura, F. Iwata, O. Fogel, Z. Kotler, N. Zhou, K. Charipar, A. Piqué, P. Rohner, D. Poulikakos, S. Lee, S. K. Seol, I. Utke, C. van Nisselroy, T. Zambelli, J. M. Wheeler, R. Spolenak [DOI]
[19]. Local electroplating deposition for free-standing micropillars using a bias-modulated scanning ion conductance microscope
Microsystem Technologies 26/ 1333-1342 (2020) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] K. Nakazawa, M. Yoshioka, Y. Mizutani, T. Ushiki, F. Iwata [DOI]
[20]. Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices
AIP Advances 9/ 115011- (2019) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] T. Uruma, C. Tsunemitsu, K. Terao, K. Nakazawa, N. Satoh, H. Yamamoto, and F. Iwata
[21]. Development of scanning capacitance force microscopy using the dissipative force modulation method
Measurement Science and Technology 31/ 035904- (2019) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] T. Uruma, N. Satoh, H. Yamamoto and F. Iwata
[22].
62/8 48-53 (2019) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] 上堀内 武尉, 大塚 洋一, 竹内 彩, 岩田 太, 松本 卓也
[23]. Direct Delivery of Cas9-sgRNA Ribonucleoproteins into Cells Using a Nanoneedle Array
Appl. Sci. 9/965 - (2019) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] A. Yamagishi , D. Matsumoto , Y. Kato , Y. Honda , M. Morikawa , F. Iwata , T. Kobayashi, and C. Nakamura [DOI]
[24]. Micropillar fabrication based on local electrophoretic deposition using a scanning ion conductance microscope with a theta nanopipette
Jpn. J. Appl. Phys 58/ 046503- (2019) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] M. Yoshioka, Y. Mizutani, T. Ushiki, K. Nakazawa, and F. Iwata [DOI]
[25]. Visualization of Sampling and Ionization Processes in Scanning Probe Electrospray Ionization Mass Spectrometry
Mass Spectrom. 7/2 S0078- (2018) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] B. Kamihoriuchi, Y. Otsuka, A.Takeuchi, F. Iwata, T. Matsumoto [DOI]
[26]. Measurement of lateral removal force for a baked polymer particle on a glass plate
J. Photopolym. Sci. Tec. 31/3 403-407 (2018) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Sanada, E. Tokuda, F. Iwata, C. Takatoh, A. Fukunaga, H. Hiyama
[27]. Investigation of an n－layer in a silicon fast recovery diode under applied bias voltagesusing Kelvin probe force microscopy
Jpn. J. Appl. Phys 57/8S1 08NB11-1- (2018) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] T. Uruma, N. Satoh, H.Yamamoto, and F. Iwata
[28]. Scanning ion conductance microscopy for visualizing the three-dimensional surface topography of cells and tissues
Seminars in Cell & Developmental Biology 73/ 125-131 (2018) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]T. Ushiki [共著者]M. Nakajima,Y. Mizutani,F. Iwata [Notes] IF 6.614
[29]. Local electrophoretic deposition using a nanopipette for micropillar fabrication
Jpn. J. Appl. Phys. 56/ 126701-1-126701-7 (2017) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]J. Metoki [Notes] IF 1.384
[30]. A new cell separation method based on antibody-immobilized nanoneedle arrays for the detection of intracellular markers
Nano Letters 17/ 7117- 7124 (2017) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] R. Kawamura, M. Miyazaki ,K. Shimizu, Y. Matsumoto,Y. Silberberg, R. Ramachandra, M. Iijima, S. Kuroda, F. Iwata, T. Kobayashi,,C. Nakamura [Notes] IF 12.712
[31]. Local electrophoresis deposition assisted by laser trapping coupled
Jpn. J. Appl. Phys. 56/ 105502.1-‐105502.6 (2017) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F.Iwata [共著者]T. Matsuura,T. Takai [Notes] IF 1.384
[DOI]
[32]. Mechanoporation of living cells for delivery of macromolecules
Journal of Bioscience and Bioengineering 122/6 748-752 (2017) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]C. Nakamura [共著者]D. Matsumoto, A. Yamagishi, M. Saito, R. R. Sathuluri,Y. R. Silberberg,F. Iwata,T. Kobayashi
[33].
86/9 791-795 (2017) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]岩田 太 [共著者]牛木 辰男
[34].
82/2 135- 139 (2017) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] 岩田 太
[35]. Reduced Sampling Size with Nanopipette for Tapping-Mode Scanning Probe ElectrosprayIonization Mass Spectrometry Imaging
Mass Spectrometry 5/S0054 1-6 (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Kohigashi,Y. Otsuka, R. Shimazu,T. Matsumoto,F. Iwata, H. Kawasaki, R. Arakawa
[36]. Mechanoporation of living cells for delivery of macromolecules using nanoneedle array
Journal of Bioscience and Bioengineering 122/6 748- 752 (2016) [Refereed] refereed [Internationally co-authored papers] internationally co-authored paper
[Lead author or co-author] co-author
[Author] D. Matsumoto, A. Yamagishi,M. Saito, R. R. Sathuluri,Y. R. Silberberg,F. Iwata,T. Kobayashi ,C. Nakamura [Notes] IF 2.240
[37]. Argon gas flow through glass nanopipette
Jpn. J. Appl. Phys. 55/(num) 125202.1-125202.5 (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Takami, K. Nishimoto,T. Goto,S. Ogawa,F. Iwata, Y. Takakuwa [Notes] IF 1.384
[38]. Scanning Nanopipette Probe Microscope for Nanofabrication Using atmospheric pressure plasma jet
Advances in Intelligent Systems and Computing 1519/ 109- 115 (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]岩田 太 [共著者]F. Iwata,D. Morimatsu,H. Sugimoto,A. Nakamura,A. Ogino M. Nagatsu
[39]. Development of a scanning nanopipette probe microscope for fine processing using atmospheric pressure plasma jet
Jpn. J. Appl. Phys 55/ 08NB15- (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]D. Morimatsu,H. Sugimoto, A. Nakamura,A. Ogino, M. Nagatsu [Notes] IF値 1.122
[40]. Maskless localized patterning of biomolecules on carbon nanotube microarray functionalized by ultrafine atmospheric pressure plasma jet using biotin-avidin system
Appl.Phys.Lett. 109/ 023701 - (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Abuzairi, M. Okada,R. W. Purnamaningsih,N. R. Poespawati,F. Iwata ,M. Nagatsu
[41]. Development of SEM for Realtime 3D Imaging and Its Applications in Biology
Hitachi Review 65/7 - (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Ushiki, F. Iwata,W. Kotake,S. Ito
[42].
98 /05 327- 331 (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] 牛木 辰男,岩田 太,小竹 航,伊東 祐博
[43]. ATP-mediated release of a DNA-binding protein from a silicon nanoneedle array
Electrochemistry 85/5 305-307 (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]C. Nakamura [共著者]D. Matsumoto, M. Nishio, Y. Kato, W. Yoshida, K. Abe, K. Fukazawa, K. Ishihara, F. Iwata, K. Ikebukuro, C. Nakamura [Notes] IＦ値 1.03
[44]. Developments for Physical Cleaning Sample with High Adhesion Force Particles and Direct Measurement of its Removal Force
Solid State Phenomena 255/ 201-206 (2016) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] E. Tokuda,T. Sanada, F. Iwata, C. Takato, H. Hiyama, F. Akira
[45]. Oscillating high-aspect-ratio monolithic silicon nanoneedle array enables efficient delivery of functional bio-macromolecules into living cells
Scientific Reports 5/ 15325- (2015) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]C. Nakamura [共著者]D. Matsumoto,R. R. Sathuluri, Y. Kato, Y. R. Silberberg, R. Kawamura, F. Iwata, T. Kobayashi [Notes] IF 5.578
[46]. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate
J. Appl. Phys 118/ 134701- (2015) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]M. Adachi,S. Hashimoto [Notes] IF2.274
[47]. Development of a single cell electroporation method using a scanning ion conductance microscope with a theta type probe pipet
Jpn. J. Appl. Phys 54 (2015) / 08LB04- (2015) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]S. Sakurai, K. Yamazaki ,T. Ushiki,F. Iwata [Notes] IF 1.127
[48]. Investigation of shear force of a single adhesion cell using a self-sensitive cantilever and fluorescence microscopy
Jpn. J. Appl. Phys 54 (2015)/ 08LB03- (2015) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]S. Hashimoto, M. Adachi,F. Iwata [Notes] IF値 1.127
[49]. Loca deposition using an electrostaric inkjet technique with a nanopipette for photomask repair
Int.J.Nanomanufacturig 11/3/4 111- 121 (2015) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]H. Ui
[50].
134/12 812- 815 (2014) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]岩田 太 [共著者]岩田 太,牛木辰男
[51]. Three-dimensional microfabrication using local electrophoresis deposition and a laser trapping technique
Optics Express 22/23 28109-28117 (2014) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]T. Takai,H. Nakao,F. Iwata [Notes] IF値 3.525
[52]. A Green Approach for Highly Reduction of Graphene Oxide by Supercritical Fluid
Advanced Materials Research 1004/1005 1013- 1016 (2014) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] C. Y．Kong,Y. Shiratori,T. Sako, F. Iwata
[53]. Local electroporation of a single cell using a scanning ion conductance microscope
Jpn. J. Appl. Phys 53 / - 036701 (2014) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]F. Iwata,K. Yamazaki,K. Ishizaki,T. Ushiki [Notes] IF値 1.057
[54]. Development of a Self-Sensing probe for Local Depositions in Liquid Condition
Int. J. Nanomanufacturing 10 /4 309-404 (2014) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]S. Ito,F. Iwata
[55]. Development of nanomanipulator using a high-speed atomic force micro scope coupled with a haptic device
Ultramicroscopy 133/ 88- 94 (2013) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]F. Iwata,Y. Ohashi,I. Ishisaki, L. M. Picco,T. Ushiki, [Notes] IF 2.35
[56].
34/9 482-487 (2013) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] 牛木 辰男,中島 真人,岩田 太
[57]. A compact nano manipulator based on an atomic force microscope coupling with a scanning electron microscope or an inverted optical microscope
J Micro-Bio Robot 1.8/ 25- 32 (2013) [Refereed] refereed [Internationally co-authored papers] internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者] F. Iwata,Y. Mizuguchi, H. Ko,T. Ushiki [Notes] IF値1.804
[58]. Scanning ion conductance microscopy for imaging biological samples in liquid
Micron 43/ 1390-1398 (2012) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Ushiki,M. Nakajima,M. Choi,S. J. Cho,F. Iwata [Notes] IF値1.876
[59]. Probe type micro magnetic manipulator utilising localised magnetic field with closed-loop magnetic path
Int. J. Nanomanufacturing 1.8/1/2 161-172 (2012) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]S. Ito, K. Ito, F. Iwata
[60]. Nanomanipulator based on a high-speed atomic force microscopy
Key Eng.Mater 516/(num) 396-401 (2012) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]I. Ishisaki,Y. Ohashi,T. Ushiki,F. Iwata [Notes] IF: 0.224
[61].
O plus E 34/3 - (2012) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]岩田 太 [共著者]岩田 太,牛木辰男
[62]. Direct observation of potassium ions in HeLa cell with ion-selective nano-pipette probe
J. Appl. Phys 111/ 044702- (2012) [Refereed] refereed [Internationally co-authored papers] internationally co-authored paper
[Lead author or co-author] co-author
[Author] T. Takami,F. Iwata,K. Yamazaki,J. W. Son,J. K. Lee,B. H. Park,T. Kawai [Notes] IF値1.057
[63]. Nanomanipulation of biological samples using a compact atomic force microscope under scanning electron microscope observation
J.Electron Microscopy 60/6 359-366 (2011) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F.Iwata, [共著者]F. Iwata,Y. Mizuguchi,H. Ko,T. Ushiki
[64]. Nanometer-scale Deposition of Metal Plating Using a Nanopipette Probe in Liquid Condition
Jpn. J. Appl. Phys. /50 08LB15- (2011) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]S. Ito,F. Iwata [Notes] IF値1.06
[65]. Operation of Self-Sensitive Cantilever in Liquid for Multiprobe Manipulation
Jpn.J.Appl.Phys 49/ 08LB14 5- (2010) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] F. Iwata,Y. Mizuguchi,K. Ozawa,T. Ushiki [Notes] 1.018
[66].
76/ 64-68 (2010) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]岩田 太 [共著者]岩田 太,伊東 聡,中尾 秀信,七里 元晴
[67]. Volume Control of Metal-Plating Deposition Using a Nanopipette Probe by Controlling Electric Charge
Jpn.J.Appl.Phys 49/08LB16 5- (2010) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] S. Ito,T. Keino,F. Iwata [Notes] IF値1.018
[68].
45/3 198- 201 (2010) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] 牛木 辰男,伊藤 裕博,伊藤 広,岩田 太,甲賀 大輔
[69]. Production of ultrafine atmospheric pressure plasma jet with nano-capillary
Thin Solid Films 518/* 3457-3460 (2010) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] R. Kakei ,A. Ogino,F. Iwata,M. Nagatsu [Notes] IF値1.909
[70]. Volume Control of Metal-Plating Deposition Using a Nanopipette Probe by Controlling Electric Charge
Jpn. J. Appl. Phys 49/ 08LB16 (5page)- (2010) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]F. Iwata,S. Ito,T. Keino [Notes] IF値 1.018
[71].
54/12 60-63 (2009) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] 岩田 太
[72].
75/11 1305-1309 (2009) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] 深谷次助,佐々木彰,岩田太,田口敬之,橋本保幸,山中崇志
[73].
112/10 850- (2009) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] 岩田 太
[74]. Local electrophoresis deposition ofnanomaterials assisted by a laser trappingtechnique"
Nanotechnology 20/ 235303- 235308 (2009) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]F. Iwata,M. Kaji,A. Suzuki,S. Ito,H. Nakao
[75]. Development of a nano manipulator based on an atomic force microscope coupled with a haptic device: a novel manipulation tool for scanning electron microscopy
Arch Histol Cytol 72/ 271-278 (2009) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]F. Iwata,K. Kawanishi,H. Aoyama,T. Ushiki
[76]. Removal method of nano-cut debris for photomask repair usingan atomic force microscopy system
48/ 08JB20-1-4 (2009) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]K. Saigo,T. Asao,M. Yasutake,O. Takaoka,T. Nakaue,S. Kikuchi
[77].
59/8 49~54- (2008) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] F.Iwata [Notes] ／共著担当箇所（59巻8号, pp. 49-54）
[78].
Molecular Electronics and Bioelectronics 19/3 166-170 (2008) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] 岩田 太
[79]. Nanometer-Scale Manipulation and Ultrasonic Cutting Using an Atomic ForceMicroscope Controlled by a Haptic Device as a Human Interface"
Jpn.J.Appl.Phys 4/7 6181-6185 (2008) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]K. Ohara,Y. Ishizu,A. Sasaki,H. Aoyama,T. Ushiki
[80].
73 /10 1164-1168 (2007) [Refereed] refereed
[Lead author or co-author] co-author
[Author] [責任著者]淵脇大海 [共著者]大田明,見崎大悟,岩田太,臼田孝,青山尚之
[81].
73/8 955-959 (2007) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]淵脇大海 [共著者]大田明,見崎大悟,岩田太,臼田孝,青山尚之
[82].
22/ 372-377 (2007) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]中尾秀信 [共著者]岩田太,柄澤英範,林英樹,三木一司
[83].
75/6 484-488 (2007) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] F. Iwata
[84]. Nanometre-scale deposition of colloidal Au particles using electrophoresis in a nanopipette probe
Nanotechnology 18/ 10531-10534 (2007) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]F. Iwata,S. Nagami,Y. Sumiya,A. Sasaki
[85].
71/3 307-310 (2005) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] 岩田 太
[86]. Fabricating and Aligning ð-Conjugated Polymer-Functionalized DNA Nanowires: Atomic Force Microscopic and Scanning Near-Field Optical Microscopic Studies
LANGMUIR 21/17 7945-7950 (2005) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]H. Nakao [共著者]H. Hayashi,F. Iwata,H. Karasawa,K. Hirano,S. Sugiyama,T. Ohtani
[87]. Nanometer-scale Metal Plating Using a Scanning Shear-Force Microscope with an Electrolyte-Filled Micropipette Probe
Jpn. J. Appl. Phys. 43/ 4482-4485 (2004) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]Y. Sumiya,A. Sasaki [Notes] IF値1.142
[88]. Submicrometer-scale fabrication of polycarbonate surface using a scanning micropipette probe micrscope
Nanotechnology 15/ 422-426 (2004) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]Y. Sumiya,S. Nagami,A. Sasaki
[89].
73/ 490-493 (2004) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]岩田 太 [共著者]佐々木彰
[90].
144/ 154-159 (2003) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] 岩田 太
[91]. Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscope
Wｅａｒ 254/10 1050-1055 (2003) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]M. Yamaguchi,A. Sasaki
[92]. Current-sensing scanning near-field optical microscopy using a metal probe for nanometer-scale observation of electrochromic film
J. Microscopy 210/ 241-245 (2003) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]K. Mikage,H. Sakaguchi,M. Kitao,A. Sasaki
[93]. The use of capillary force for fabricating probe tips for scattering-type near-field scanning optical microscopes
Appl.Phys.Lett. 82/10 1598-1600 (2003) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]Y. Kawata [共著者]S. Urahara,M. Murakami,F. Iwata
[94]. Nanometer-scale properties of electrochromic films investigated by current-sensing scanning near-field optical microscopy
/ 343-348 (2003) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]K. Mikage,M. Kitao,A. Sasaki
[95]. Nanometer-scale electrochromic modification of NiO films using a novel technique of scanning near-field optical microscopy
Solid State Ionics 165/ 7-13 (2003) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]F. Iwata, K.Mikage,H. Sakaguchi,M. Kitao,A. Sasaki
[96]. Nanometer-Scale Electrochromic Properties Observed by Scanning Near-Field Opical Microscopy Capable of Local Current Sensing
Trans. Mat. Res. Soc. Jpn., 27/ 361-364 (2002) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]K. Mikage,H. Sakaguchi,M. Kitao,A. SasakI
[97].
68/7 958-961 (2002) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]深谷 次助 [共著者]佐々木 彰,岩田 太,山本 和彦,若杉 靖夫
[98].
18/2 23-27 (2002) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] F. Iwata
[99]. Nanometer-scale modification of a urethane-urea copolymer film using local field enhancement at an apex of a metal coated probe
Nanotechnology 13/(num) 138-142 (2002) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]K. Kobayashi,A. Sasaki,Y. Kawata,C. Egami , O. Sugihara,M. Tuchimori, O. Watanabe
[100]. Determination of Performance on Tunnel Conduction Through Molecular Wire Using a Conductive Atomic Force Microscope
Appl Phys.Lett. 79/22 3708-3710 (2001) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]A. Sasaki [共著者]A. Hirai,F. Iwata
[101]. Nano wearing property of a fatigued Polycarbonate surface Studied by atomic force Microscopy
J. Vac. Sci. & Technol. B 19/ 666-670 (2001) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者] Y. Suzuki, Y. Moriki,S. Koike, A. Sasaki
[102]. Photoconductive imaging in a photor scanning funneling microscope capable of point contact current sensing using a conductive fiber
J. Microscopy 202/ 188-192 (2001) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]D. Someya, H. Sakaguchi,Y. Igasaki,M. Kitao, T. Kubo, A. sasaki
[103]. Semilinear Self-Pumped Phase-Conjugate Mirror Using Two Coupled Cu:(K0.5Na0.5)0.2(Sr0.61Ba0.39)0.9Nb2O6 Crystals
Jpn. J. Appl. Phys. 39/ 5665-5667 (2000) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]M. Doi [共著者]A. Sasaki,F. Iwata,Y. Zheng [Notes] IF値1.157
[104]. Conductive atomic force microscopy study of InGaN films grown by hot-wall epitaxy with a mixed(Ga+In)
J. Appl. Phys. 88/ 1670-1673 (2000) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]S. Chu,A. Sasaki,K. Ishino,A. Ishida,H. Fujiyasu
[105]. Local elasticity imaging of nano bundle structure of polycarbonate surface using atomic force microscopy
Nanotechnology 8/ 10-15 (2000) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]T. Matsumoto, A. Sasaki
[106]. Scratching on polystyrene thin film without bumps using atomic force microscopy
J. Vac. Sci. & Technol. B 17/ 2452-2456 (1999) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]T. Matumoto,R. Ogawa,A. Sasaki
[107]. Generation of Forward Phase-Conjugate Beam by Cu:KNSBN-Cat Type Self-Pumped Phase-Conjugator
Jpn. J. Appl. Phys. 38/ 5646-5648 (1999) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]M. Doi [共著者]A. Sasaki,F. Iwata,Y. Zheng
[108].
28/9 514-518 (1999) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]深谷 次助 [共著者]佐々木 彰,岩田 太,長坂 学
[109]. Observation of a polystyrene surface modified by ultrasonic scratching using atomic force microscopy
Jpn. J. Appl. Phys. 38/ 3936-3939 (1999) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]T. MAtumoto,R. Ogawa,A. Sasaki
[110]. Nanometer-scale photoelectric property of organic thin films investigated by a photoconductive atomic force microscopy
Jpn. J. Appl. Phys 38/ 3908 -3911 (1999) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]H. Sakaguchi [共著者]F. Iwata,A. Hirai,A. Sasaki,T. Nagamura
[111].
28/9 514-518 (1999) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]深谷 次助 [共著者]佐々木 彰,岩田 太,長坂 学
[112]. Visible-laser ablation on a nanometer scale using urethane-urea copolymers
Opt.Commun 157/ 150-154 (1998) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]C. Egami [共著者]Y. Kawata,Y. Aoshima,F. Iwata,O. Sugihara,M. Tsuchimori,O. Watanabe,N. Okamoto
[113]. In-situ atomic force microscopy combined quartz crystal microbalance study of Ag electro deposition on Pt thin film
Appl. Phys. A 66/ s463-465 (1998) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]K. Saruta,A. Sasaki
[114]. Ultrasonic micromachining on Al thin film using atomic force microscopy combined quartz crystal resonator
Thin Solid Films 302/ 122-126 (1997) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]M. Makoto,A. Sasaki
[115]. Nanometer-scale layer removal of aluminum and polystyrene surfaces by ultrasonic scratching
Jpn. J. Appl. Phys. 36/ 3834-3838 (1997) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]M. Kawaguchi,A. Sasaki
[116]. Ultrasonic micromachining on Al thin film using atomic force microscopy combined quartz crystal resonator
Thin Solid Films 302/ 122-126 (1997) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]M. Kwaguchi,A. Sasaki
[117]. Scanning Tunneling Microscopy Combined Quartz Crystal Microbalance for Study of NH3 Adsorption on Ag Thin Film
Thin Solid Films 299/ 78-82- (1997) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]M. Kawaguchi,A. Sasaki
[118]. A Stable Scanning Tunnneling Microscopy Designed for Investigations of Organic Thin Films in Air
Rev.Sci.Instrum. 68/ 1296-1299 (1997) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]A. Sasaki [共著者]F. Iwata,A. Katsumata,H. Aoyama,T. Akiyama,Y. Fuziyasu
[119]. Shearing Stress on the Surface Topography by Scanning Shearing Stress Microscopy
J. Vac. Sci. & Technol. B 14/ 849-851 (1996) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]F. Iwata [共著者]A. Sasaki,M. Kawaguchi,A. Katsumata,H. Aoyama
[120].
62/1 150-154 (1996) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] author
[Author] [責任著者]岩田 太 [共著者]川口 誠,佐々木 彰,勝又 章,青山 尚之
[121]. Miniature Robot with Micro Capillary Capturing Probe for Surface Clearing Operation
J. Robotic. Mech. 7/ 488-492 (1995) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]H. Aoyama [共著者]F. Iwata,J. Fukaya,A. Sasaki
[122]. Scanning Shearing-Stress Microscopy of Gold Thin Films
Jpn. J. Appl. Phys. 33/ 547-L549 (1994) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]A. Sasaki [共著者]A. Katsumata,F. Iwata,H. Aoyama
[123]. Scanning Shearing-Stress Microscope
Appl. Phys. Lett. 64/1 124-125 (1994) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]A. Sasaki [共著者]A. Katsumata,F. Iwata,H. Aoyama
[124]. Scanning Tunneling Microscopy and Barrier-Height Observation of Stearic Acid Thin Films Prepared by Hot-Wall Technique
Jpn. J. Appl. Phys. 32/ .2952-2957 (1993) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]A. Sasaki [共著者]F. Iwata,A. Katsumata,J. Fukaya,H. Aoyama,T. Akiyama,Y. Nakano,H. Fujiyasu
[125].
59/6 987-992 (1993) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]佐々木 彰 [共著者]岩田 太,勝又 章,和波 真吾,深谷 次助,青山 尚之
[126].
59/1 95-100 (1993) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]佐々木 彰 [共著者]川上 博己,山内 清茂,野崎 明俊,岩田 太,深谷 次助,小坂 明,青山 尚之,久保 高啓
[127].
21/2 95-101 (1992) [Refereed] refereed [Internationally co-authored papers] non-internationally co-authored paper
[Lead author or co-author] co-author
[Author] [責任著者]佐々木 彰 [共著者]山田 浩史,深谷 次助,岩田 太,加藤 久季,青山 尚之,宮尾 正大,村上 健司,石川 賢司,野村 卓志,山口 豪,萩野 實 |